Chronological List of Publications
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A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals
- Jan Verspecht, Jason Horn, David Root
- ARFTG Spring 2010 Conference Digest
- USA, May 2010
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Bursts of Pulses for Time Domain Large Signal Measurements
- Jad Faraj, Guillaume Callet, Fabien De Groote, Jan Verspecht, Raymond Que're', Jean-Pierre Teyssier
- ARFTG Spring 2009 Conference Digest
- USA, June 2009
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Extension of X-parameters to Include Long-Term Dynamic Memory Effects
- Jan Verspecht, Jason Horn, Loren Betts, Daniel Gunyan, Roger Pollard, Chad Gillease, David Root
- Conference Record of the IEEE Microwave Theory and Techniques Symposium 2009, pp. 601-604
- USA, June 2009
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Pulse Profiling for AlGaN/GaN HEMTs Large Signal Characterizations
- Jad Faraj, Fabien De Groote, Jean-Pierre Teyssier, Jan Verspecht, Raymond Quere, Raphael Aubry
- Conference Record of the 38th European Microwave Conference
- The Netherlands, October 2008
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X-parameter measurement and simulation of a GSM handset amplifier
- Jason Horn, Jan Verspecht, Daniel Gunyan, Loren Betts, David Root, Joakim Eriksson
- Conference Record of the 3rd European Microwave Integrated Circuits Conference
- The Netherlands, October 2008
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High power on-wafer capabilities of a time domain load-pull setup
- Fabien De Groote, Jean-Pierre Teyssier, Jan Verspecht, Jad Faraj
- 71st ARFTG Conference Digest
- USA, June 2008
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Introduction to Measurements for Power Transistor Characterization
- Fabien De Groote, Jean-Pierre Teyssier, Tony Gasseling, Olivier Jardel, Jan Verspecht
- IEEE Microwave Magazine, Vol. 9, No. 3, pp. 70-85
- USA, June 2008
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Advanced Time Domain Loadpull Technique for Characterization of Microwave Power Transistors
- Jan Verspecht, Fabien De Groote, Jean-Pierre Teyssier
- ESA Microwave Technology and Techniques Workshop 2008
- The Netherlands, May 2008
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On-Wafer Time Domain Load-Pull Optimization of Transistor Load Cycle with the New Multi-Harmonic MPT Tuner
- Fabien De Groote, Olivier Jardel, Jean-Pierre Teyssier, Tony Gasseling, Jan Verspecht, Vince Mallette, Christos Tsironis
- 69th ARFTG Conference Digest
- USA, June 2007
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Multi-tone, Multi-port, and Dynamic Memory Enhancements to PHD Nonlinear Behavioral Models from Large-signal Measurements and Simulations
- Jan Verspecht, Daniel Gunyan, Jason Horn, Jianjun Xu, Alex Cognata, David Root
- Conference Record of the IEEE Microwave Theory and Techniques Symposium 2007, pp. 969-972
- USA, June 2007
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Caracte'risation temporelle des composants non-line'aires
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Load-pull measurement of transistor negative input impedance
- Fabien De Groote, Jan Verspecht, Jean-Pierre Teyssier, Raymond Quere
- 68th ARFTG Conference Digest, pp. 151-154
- USA, December 2006
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Polyharmonic Distortion Modeling
- Jan Verspecht, David Root
- IEEE Microwave Magazine, Vol. 7, No. 3, pp. 44-57
- USA, June 2006
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Accurate Phase Measurements of Broadband Multitone Signals using a Specific Configuration of a Large Signal Network Analyzer
- Mohammed El Yaagoubi, Guillaume Neveux, Denis Barataud, Jean-Michel Nebus and Jan Verspecht
- Conference Record of the IEEE Microwave Theory and Techniques Symposium 2006, pp. 1448-1451
- USA, June 2006
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Large Signal Network Analysis
- Jan Verspecht
- IEEE Microwave Magazine, Vol. 6, No. 4, pp. 82-92
- USA, December 2005
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Hot S-Parameter Techniques: 6 = 4 + 2
- Jan Verspecht, Denis Barataud, Jean-Pierre Teyssier and Jean-Michel Nebus
- 66th ARFTG Conference Digest, pp. 7-15
- USA, December 2005
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Time Domain Harmonic Load-Pull of an AlGaN/GaN HEMT
- Fabien De Groote, Olivier Jardel, Jan Verspecht, Denis Barataud, Jean-Pierre Teyssier, Raymond Quere
- 66th ARFTG Conference Digest, pp. 142-145
- USA, December 2005
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Broad-Band Poly-Harmonic Distortion (PHD) Behavioral Models From Fast Automated Simulations and Large-Signal Vectorial Network Measurements
- David E. Root, Jan Verspecht, David Sharrit, John Wood and Alex Cognata
- IEEE Transactions on Microwave Theory and Techniques, Vol. 53, No. 11
- November 2005
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Broad-band, multi-harmonic frequency domain behavioral models from automated large-signal vectorial network measurements
- Jan Verspecht, David Root, John Wood, Alex Cognata
- Conference Record of the IEEE Microwave Theory and Techniques Symposium 2005
- USA, June 2005
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An improved coupling method for time domain load-pull measurements
- Fabien De Groote, Jan Verspecht, Christos Tsironis, Denis Barataud, Jean-Pierre Teyssier
- 65th ARFTG Conference Digest
- USA, June 2005
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Linearization of Large-Signal Scattering Functions
- Jan Verspecht, Dylan F. Williams, Dominique Schreurs, Kate A. Remley, Michael D. McKinley
- IEEE Transactions on Microwave Theory and Techniques, Vol. 53, No. 4, pp. 1369-1376
- April 2005
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Large-Signal Network Analysis - 'Going beyond S-parameters'
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The Return of the Sampling Frequency Convertor
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Scattering Functions for Nonlinear Behavioral Modeling in the Frequency Domain
- Jan Verspecht
- Fundamentals of Nonlinear Behavioral Modeling: Foundations and Applications, Workshop at the International Microwave Symposium 2003
- USA, June 2003
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Apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test, under different load conditions
- Jan Verspecht, Ewout Vandamme
- US Patent Application Publication, No. US 2003/0058058 A1
- USA, March 2003
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Method of and an arrangement for characterizing non-linear behavior of RF and microwave devices in a near matched environment
- Frans Verbeyst, Jan Verspecht
- US Patent Application Publication, No. US 2003/0057963 A1
- USA, March 2003
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Method of and an apparatus for collecting RF input and output and biasing signal data of a device under test
- Jan Verspecht
- US Patent Application Publication, No. US 2003/0057964 A1
- USA, March 2003
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Calibration Issues for the Large Signal Network Analyzer (LSNA)
- Steve Vandenplas, Jan Verspecht, Frans Verbeyst, Ewout Vandamme, Marc Vanden Bossche
- 60th ARFTG Conference Digest, pp. 99-106
- USA, December 2002
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Enhanced on-wafer time-domain waveform measurement through removal of interconnect dispersion and measurement instrument jitter
- Jonathan B. Scott, Jan Verspecht, B. Behnia, Marc Vanden Bossche, Alex Cognata, Frans Verbeyst, M.L. Thorn, D. R. Scherrer
- IEEE Transactions on Microwave Theory and Techniques, Vol. 50, No. 12, pp. 3022 -3028
- USA, December 2002
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Large-Signal Network Analysis: Going Beyond S-parameters
- Jan Verspecht, Frans Verbeyst, Marc Vanden Bossche
- URSI 2002
- Netherlands, August 2002
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Everything you've always wanted to know about Hot-S22 (but we're afraid to ask)
- Jan Verspecht
- Introducing New Concepts in Nonlinear Network Design, Workshop at the International Microwave Symposium 2002
- USA, June 2002
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Removal of Cable and Connector Dispersion in Time-Domain Waveform Measurements on 40Gb Integrated Circuits
- Jonathan Scott, Babak Behnia, Marc Vanden Bossche, Alex Cognata, Jan Verspecht, Frans Verbeyst, Mark Thorn, Daniel R. Scherrer
- International Microwave Symposium 2002
- USA, June 2002
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Straightforward and Accurate Nonlinear Device Model Parameter-Estimation Method Based on Vectorial Large-Signal Measurements
- Dominique M. M.-P. Schreurs, Jan Verspecht, Servaas Vandenberghe, Ewout Vandamme
- IEEE Transactions on Microwave Theory and Techniques, Vol. 50, No. 10, pp. 2315-2319
- 2002
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Large-Signal Network Analysis - a measurement concept to characterize nonlinear devices and systems
- Ewout Van Damme, Jan Verspecht, Frans Verbeyst, Marc Vanden Bossche
- white paper
- 2002
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Theoretical and experimental assessment of the non-linear scattering functions for the cad of non-linear microwave circuits
- Schreurs Dominique, Verspecht Jan, Acciari G., Colantonio P., Giannini F., Limiti E., Leuzzi Giorgio
- Gallium Arsenide Applications Symposium - GAAS 2001
- United Kingdom, September 2001
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Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration
- Kate A. Remley, Dylan F. Williams, Donald C. DeGroot, Jan Verspecht, John Kerley
- IEEE Microwave and Wireless Components Letters, Vol. 11, No. 5, pp. 196-198
- 2001
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Large-Signal Network Analysis: Going beyond S-parameters
- Jan Verspecht, Frans Verbeyst, Marc Vanden Bossche
- Updated Course Notes
- 2001
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Network Analysis Beyond S-parameters: Characterizing and Modeling Component Behaviour under Modulated Large-Signal Operating Conditions
- Jan Verspecht, Frans Verbeyst, Marc Vanden Bossche
- 56th ARFTG Conference Proceedings
- USA, December 2000
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Large-Signal Network Analysis: Going beyond S-parameters
- Jan Verspecht, Frans Verbeyst, Marc Vanden Bossche
- 56th ARFTG Conference Short Course Notes
- USA, November 2000
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Measurement Based Behavioural Modeling of Components under Modulated Large-Signal Operating Conditions
- Jan Verspecht, Frans Verbeyst, Marc Vanden Bossche
- 30th European Microwave Conference Proceedings
- France, October 2000
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Analysis of Interconnection Networks and Mismatch in the Nose-to-Nose Calibration
- Donald C. DeGroot, Paul D. Hale, Marc Vanden Bossche, Frans Verbeyst, Jan Verspecht
- 55th ARFTG Conference Digest, pp. 116-121
- USA, June 2000
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Beyond s-parameters: the future of network analysis
- Jan Verspecht
- Presentation at the National Institute of Standards and Technology
- USA, May 2000
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Recent Advances in the Measurement and Modeling of High-Frequency Components
- Jan Verspecht, Dominique Schreurs
- ISRAMT`99 Conference Proceedings
- Spain, December 1999
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Recent Advances in the Measurement and Black-Box Modelling of High-Frequency Components
- Jan Verspecht, Dominique Schreurs
- GAAS99 Conference Proceedings, pp. 387-392
- Germany, October 1999
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System Level Simulation Benefits from Frequency Domain Behavioral Models of Mixers and Amplifiers
- Jan Verspecht, Frans Verbeyst, Marc Vanden Bossche, Patrick Van Esch
- 29th European Microwave Conference Proceedings, Vol. 2, pp. 29-32
- Germany, October 1999
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Measurement and Control of Current/Voltage Waveforms of Microwave Transistors Using a Harmonic Load-Pull System for the Optimum Design of High Efficiency Power Amplifiers
- D. Barataud, F. Blache, A. Mallet, P. P. Bouysse, J.-M. Nebus, J. P. Villotte, J. Obregon, J. Verspecht, P. Auxemery
- IEEE Transactions on Instrumentation and Measurement, Vol. 48, No. 4, pp. 835-842
- August 1999
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Easy and Accurate Empirical Transistor Model Parameter Estimation from Vectorial Large-Signal Measurements
- D. Schreurs, J. Verspecht, S. Vandenberghe, G. Carchon. K. van der Zanden, B. Nauwelaers
- Conference Record of the IEEE Microwave Theory and Techniques Symposium 1999
- June 1999
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The Three Musketeers of Large Signal RF and Microwave Design - Measurement, Modeling and CAE
- Marc Vanden Bossche, Frans Verbeyst, Jan Verspecht
- 53rd ARFTG Conference Digest
- June 1999
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Advanced non-linear InP HEMT model parameter estimation from vectorial large-signal measurements
- Dominique Schreurs, Jan Verspecht, Servaas Vandenberghe, Karel van der Zanden, Geert Carchon, Bart Nauwelaers
- Conference Record of the 1999 Eleventh International Conference on Indium Phosphide and Related Materials, pp. 459-462
- Switserland, 1999
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Measuring, Black-Box Modelling and Simulating Transistor Nonlinear Behavior: Nonlinear S-Parameters Can Do the Job!
- Jan Verspecht, Patrick Van Esch
- GAAS 98 Conference Proceedings, pp. 45-50
- Netherlands, October 1998
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Accurately Characterizing Hard Nonlinear Behavior of Microwave Components with the Nonlinear Network Measurement System: Introducing `Nonlinear Scattering Functions'
- Jan Verspecht, Patrick Van Esch
- Proceedings of the 5th International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits, pp. 17-26
- Germany, October 1998
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Direct Extraction of the Nonlinear HEMT Model from Vectorial Large-Signal Measurements
- D. Schreurs, S. Vandenberghe, J. Verspecht, B. Nauwelaers, A. Van de Capelle
- Proceedings of the International Workshop on Advanced Black-Box Techniques for Nonlinear Modeling, pp. 228-233
- Belgium, July 1998
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The use of Feedforward ANN in the building of the non-linear behavioural models of microwave components in the frequency domain
- Patrick Van Esch, Jan Verspecht
- Proceedings of the International Workshop on Advanced Black-Box Techniques for Nonlinear Modeling, pp. 222-227
- Belgium, July 1998
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Measuring Transistor Dynamic Loadlines and Breakdown Currents under Large-Signal High-Frequency Operating Conditions
- Jan Verspecht, Dominique Schreurs
- 1998 IEEE MTT-S International Microwave Symposium Digest, Vol. 3, pp. 1495-1498
- USA, June 1998
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Measurements of time domain voltage/current waveforms at R.F. and microwave frequencies for the characterization of nonlinear devices
- D. Barataud, A. Mallet, M. Campovecchio, J.M. Nebus, J.P. Villotte, Jan Verspecht
- Conference Record of the 1998 Instrumentation and Measurement Technology Conference, Vol. 2, pp. 1006-1010
- USA, May 1998
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Quantifying the Maximum Phase-Distortion Error Introduced by Signal Samplers
- Jan Verspecht
- IEEE Transactions on Instrumentation and Measurement, Vol. 46, No. 3, pp. 660-666
- June 1997
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A Novel Time Domain Characterization Technique Of Intermodulation In Microwave Transistors. Application To The Vizualization Of The Distortion Of High Efficiency Power Amplifiers
- D. Barataud, A. Mallet, J. Ph. Fraysse, F. Blache, M. Campovecchio, J. M. Nebus, J. P. Villotte, J. Verspecht
- Conference Record of the IEEE Microwave Theory and Techniques Symposium 1997, pp. 1687-1690
- June 1997
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Characterizing Components Under Large Signal Excitation: Defining Sensible `Large Signal S-Parameters'?!
- J. Verspecht, M. Vanden Bossche, F. Verbeyst
- 49th ARFTG Conference Digest, pp. 109-117
- June 1997
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Comparison of Non-Linear Models Based on Linear and Non-linear VNA Measurements
- D. Schreurs, J. Verspecht, B. Nauwelaers, A. Barel, M. Van Rossum
- Conference Record of the 4th International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits (INMMC'96), pp. 168-173
- October 1996
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Non-Linear Table-Based Model for Gaas and INP Dual-Gate Cascode HEMTs
- D. Schreurs, Y. Baeyens, J. Verspecht, K. van der Zanden, B. Nauwelaers, W. De Raedt, M. Van Hove, M. Van Rossum
- Conference Record of the 4th International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits (INMMC'96), pp. 83-88
- October 1996
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Black Box Modelling of Power Transistors in the Frequency Domain
- Jan Verspecht
- Conference Record of the 4th International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits (INMMC'96), pp. 58-63
- October 1996
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Waveform Measurements on a HEMT Resistive Mixer
- D. Schreurs, J. Verspecht, B. Nauwelaers, A. Barel, M. Van Rossum
- 47th ARFTG Conference Digest, pp. 129-135
- June 1996
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Black Box Modelling of Hard Nonlinear Behavior in the Frequency Domain
- Jan Verspecht, Dominique Schreurs, Alain Barel, Bart Nauwelaers
- Conference Record of the IEEE Microwave Theory and Techniques Symposium 1996, pp. 1735-1738
- June 1996
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Large-Signal HEMT Modelling, Specifically Optimized For InP Based HEMTs
- D. Schreurs, Y. Baeyens, K. van der Zanden, J. Verspecht, M. Van Hove, W. De Raedt, B. Nauwelaers, M. Van Rossum
- 1996 Conference Proceedings of the Eight International Conference on Indium Phosphide and Related Materials, pp. 638-641
- April 1996
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Accurate On Wafer Measurement of the Large-Signal Behavior of a Nonlinear Microwave Device
- Jan Verspecht, Peter Debie, Alain Barel, Luc Martens
- Revue HF, No. 2, pp. 35-45
- Belgium, 1996
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Broadband Sampling Oscilloscope Characterization with the 'Nose-to-Nose' Calibration Procedure: a Theoretical and Practical Analysis
- Jan Verspecht
- IEEE Transactions on Instrumentation and Measurement, Vol. 44, No. 6, pp. 991-997
- December 1995
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Describing Functions Can Better Model Hard Nonlinearities In The Frequency Domain Than The Volterra Theory
- Jan Verspecht
- Annex to Doctoral Dissertation - Vrije Universiteit Brussel
- Belgium, November 1995
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Calibration of a Measurement System for High Frequency Nonlinear Devices
- Jan Verspecht
- Doctoral Dissertation - Vrije Universiteit Brussel
- Belgium, November 1995
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Accurate On Wafer Measurement Of Phase And Amplitude Of The Spectral Components Of Incident And Scattered Voltage Waves At The Signal Ports Of A Nonlinear Microwave Device
- Jan Verspecht, Peter Debie, Alain Barel, Luc Martens
- Conference Record of the IEEE Microwave Theory and Techniques Symposium 1995, pp. 1029-1032
- USA, May 1995
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VIOMAP, a Way to Predict the Distortion of a Constellation Diagram due to Amplifier Nonlinearities
- Frans Verbeyst, Jan Verspecht, Marc Vanden Bossche
- Digest of IEEE 1994 MTT-S European Topical Congress, Technologies for Wireless Applications, pp. 81-85
- November 1994
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Compensation of Timing Jitter-Induced Distortion of Sampled Waveforms
- Jan Verspecht
- IEEE Trans. Instrum. Meas., Vol. 43, No. 5, pp. 726-732
- October 1994
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Broadband Sampling Oscilloscope Characterization with the 'Nose-to-Nose' Calibration Procedure: A Theoretical Analysis
- Jan Verspecht
- Conference Record of the 1994 IEEE Instrumentation and Measurement Technology Conference, pp. 526-529
- Japan, May 1994
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Calibrated Vectorial Nonlinear Network Analyzers
- Tom Van den Broeck, Jan Verspecht
- Conference Record of the IEEE Microwave Theory and Techniques Symposium 1994, pp. 1069-1072
- USA, May 1994
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Accurate Spectral Estimation Based on Measurements with a Distorted-Timebase Digitizer
- Jan Verspecht
- IEEE Transactions on Instrumentation and Measurement, Vol. 43, No. 2, pp. 210-215
- April 1994
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Individual Characterization of Broadband Sampling Oscilloscopes with a 'Nose-to-Nose' Calibration Procedure
- Jan Verspecht, Ken Rush
- IEEE Transactions on Instrumentation and Measurement, Vol. 43, No. 2, pp. 347-354
- April 1994
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Individual Characterization of Broadband Sampling Oscilloscopes with a 'Nose-to-Nose' Calibration Procedure
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Accurate Spectral Estimation Based On Measurements With A Distorted-Timebase Digitizer
- Jan Verspecht
- Conference Record of the 1993 IEEE Instrumentation and Measurement Technology Conference, pp. 699-704
- USA, May 1993
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Individual Characterization of Broadband Sampling Oscilloscopes with a 'Nose-to-Nose' Calibration Procedure
- Jan Verspecht, Ken Rush
- Conference Record of the 1993 IEEE Instrumentation and Measurement Technology Conference, pp. 203-208
- USA, May 1993
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PhD. Activity Report: Oct.90 - July 91
Copyright 2003 Jan Verspecht bvba